First-class devices thanks to first-class signals

The R&S®SMA100B delivers uncompromising maximum performance.

• It provides the purest output signals with the highest output power levels and the lowest harmonics.
• Frequency range from 8 kHz up to 67 GHz (overrange 72 GHz)
• Frequency extension from 50 GHz to 170 GHz with the R&S®SZM frequency multiplier
• Lowest SSB phase noise of –132 dBc (typ.) at 10 GHz and 10 kHz offset
• Virtually no wideband noise of –162 dBc (meas.) at 10 GHz and 30 MHz offset
• Maximum output power exceeds 30 dBm across wide frequency ranges
• Exceptionally low harmonics
• State-of-the-art GUI with touch display

Very high uncompromising output power

Large dynamic range, excellent level accuracy and level repeatability

Very high output power is often required in the microwave frequency range because the higher the frequency, the more attenuation. The R&S®SMA100B offers different output power stages to compensate for such losses. As a result, no downstream external amplifier is required. Exceptionally high output power levels (measured values)

• Ultra high output power up to 38 dBm with the 6 GHz instrument
• Over 30 dBm at 18 GHz and 28 dBm at 20 GHz with the 20 GHz instrument
• Over 30 dBm between 20 GHz and 36 GHz with the 40 GHz instrument
• Over 22 dBm between 40 GHz and 65 GHz with the 67 GHz instrument

UCOR (user correction)

Compensation of an external frequency response

DUTs are often connected to the signal generator via long cables or other frequency dependent components, making it very important to compensate for frequency response. The R&S®SMA100B provides a user correction (UCOR) function for this purpose. Together with an R&S®NRP power sensor, the UCOR values are automatically determined at the push of a button. A frequency response compensated RF signal is available at the new reference plane for UCOR.

Uninterrupted level sweep with high dynamic range

When measuring gain transfer functions or output saturation points in amplifiers with an integrated automatic level control (ALC), the signal generator must provide a wide uninterrupted level sweep range. The R&S®SMA100B with the R&S®SMAB-K724 option provides the following:

• Blank-free (uninterrupted) level sweep with exceptionally high dynamic range
• High level linearity across the entire level sweep range

High-end ADC and DAC component testing

Measure the true performance of your device

Analog input bandwidth and required clock frequency increase with each new ADC generation. The increase in the effective number of bits also results in a larger signal-to-noise ratio. This means that extremely clean, high-frequency signals exceeding the DUT performance are required to test ADCs and DACs. The outstanding R&S®SMA100B performance is perfect for optimizing DUTs and making improvements technically feasible in the first place.

R&S®NRP power sensor connectivity

An R&S®NRP power sensor can be connected to the R&S®SMA100B

A DUT is rarely connected directly to the generator. Cables and other components are often between the generator and the DUT. This shifts the reference plane from the generator RF output to the DUT. An R&S®NRP power sensor can be connected to the R&S®SMB100B for extremely precise calibration (tenth of a dB) on the new reference plane.

User friendly in every detail

Easy integration into test systems and innovative operating features

• Flexible 2 U or 3 H housing
• 3 HU with large 7" display and multiple front panel connectors
• Ergonomic GUI with touch display
• Frequently used items can be added to user menus for quick and easy access to any necessary settings in one place
• The R&S®SMA100B also has a SCPI macro recorder with a code generator to automatically record manual settings and create an executable MATLAB® script

HIGH-END ADC AND DAC COMPONENT TESTS

With each new ADC generation, the analog input bandwidth increases, and with it the required clock frequency. In addition, the larger effective number of bits results in a larger signal-to-noise ratio. The most advanced DACs allow the reconstruction of wideband digitized signals up into the microwave range. 

This means that extremely clean, high frequency signals that exceed the DUT performance are required to test ADCs and DACs. Its outstanding performance makes the R&S®SMA100B the benchmark solution, giving users a tool that is perfect not only for optimizing DUTs, but also for bringing them to the very edge of the technically feasible.

BASE STATION RECEIVER TESTS

Blocking tests are used to measure a receiver’s selectivity, i.e. how well a receiver can suppress interferers outside the wanted channel. For example, cellular standards define different blocking scenarios that must be applied to test a base station receiver. Both out-of-band blocking tests and in-band blocking tests are usually performed.

Interfering signals are usually stronger than the  wanted signal. Signal generators that deliver the blocking (interfering) signals must therefore offer very high spectral purity. Otherwise, the phase noise or wideband noise from the interferer would cover the wanted signal in the receive channel. 

The R&S®SMA100B meets even the highest standards because it not only exhibits extremely low wideband noise but also provides excellent phase noise performance at all carrier offsets. The phase noise performance can be further optimized to match application-specific requirements. This can be achieved by switching the PLL bandwidth from normal to narrow or vice versa as required for a specific carrier offset range.

RADAR RECEIVER TESTING

Overcome the challenge of level-controlled narrow pulses

When testing the functionality and sensitivity of radar and EW receivers, the challenge is always the same. Accurate, repeatable test signals are needed to measure the true performance of a receiver, because these devices are designed to work at the limits of what is technically feasible. For radar testing, the quality of the pulsed CW signals is the key to verifying and optimizing performance. The signal generator has to produce unmodulated pulsed CW signals that are accurate in terms of both frequency and power. They must be repeatable over a large number of pulses, and the pulse width has to be small enough to meet the requirements of the specific receiver. 

The R&S®SMA100B signal generator is ideal for this application since it can repeatably produce accurate narrow pulses, enabling engineers to reliably test the sensitivity and functionality of today’s leading-edge receivers.

High-performance automatic level control

With its high-quality pulse modulator and digital automatic level control (ALC), the R&S®SMA100B can generate pulsed CW signals with exceptional accuracy, even when the pulse width is in the nanosecond range. This cutting edge ALC design ensures that the pulse flatness and power level are consistent from pulse to pulse. In combination with the R&S®SMA100B microwave frequency options, engineers have a signal generator they can rely on to produce accurate, repeatable pulses with widths ranging from less than 100 ns to 100 s in the typical radar frequency bands.

Instantaneous pulse generation

External pulse generators are typically used when the signal generator is integrated into a larger test system. In that case, the key consideration for the signal generator is how quickly it can synchronize and modulate the incoming pulses. Conventional generators with analog ALCs can take some time to react to the incoming pulses. This means that there will be no RF output for the first tens of pulses.

Due to the modern digital ALC implemented in the R&S®SMA100B, level-controlled pulse generation starts instantaneously, irrespective of whether the internal or an external pulse generator is used. When you expect a CW pulse out of the generator immediately, that is what you will get with the R&S®SMA100B.

Pulse trains for complex test cases

When used as a standalone instrument, the R&S®SMA100B offers not only an internal pulse generator with selectable pulse width, but also a pulse train option for more complex test cases. The graphical user interface makes it easy to combine a series of pulses with different widths and pulse repetition intervals (PRI). Multiple test cases can be  created, stored and recalled.

Thanks to its exceptional RF performance, narrow pulse modulation and advanced pulse generation, the R&S®SMA100B not only produces high-quality  narrow pulses to test sensitivity, but also delivers more advanced test cases for testing the receiver functionality. The complex pulse trains make it possible to test  receiver capabilities such as the unambiguous range,  coherent processing interval (CPI) and range resolution. All in all, the R&S®SMA100B is a complete solution for testing radar and EW receivers. 

GENERATING CHIRPED RADAR SIGNALS FOR ADVANCED RADAR SYSTEM TESTING

A wide variety of radar systems, e.g. weather radars and long-range surveillance radars, benefit from pulse compression techniques. They therefore use modulation on pulse such as linear frequency modulation (chirps). Radars profit from using chirped pulses, since range resolution then only depends on the signal bandwidth. Also, processing gain is high while lower transmit power levels can be used. Consequently, the probability of intercept of the radar’s transmit signal is considerably lower.

To properly test radar receivers that use pulse compression techniques, the signal generator needs to produce chirps that are accurate in terms of chirp rate, pulse length and power level. The R&S®SMA100B can generate chirped pulses very easily by combining a pulse-modulated signal with a linear FM-modulated signal from the multifunction generator (R&S®SMAB‑K24 option). Thanks to the huge variety of setting options, the chirp is always perfectly tailored to the individual requirements. The R&S®SMA100B easily copes with large bandwidths and high chirp rates. Impairments such as noise, amplitude fluctuations and Doppler drifts can be conveniently  added. They are generated using amplitude and frequency modulation on one or more of the additional sources provided by the multifunction generator. This is an effective approach to model effects coming from real radar hardware. 

SIMULATING SCANNING RADAR ANTENNAS

Signals received by radar and EW receivers often carry simultaneous pulse and amplitude modulation. Whereas pulse modulation is performed in the transmitter, the amplitude modulation results from the antenna scan and the antenna radiation pattern. 

Generation of realistic test signals is challenging, since the radiation pattern of highly directive antennas often shows a narrow main beam, significant sidelobe power and even nulls in some directions. A large dynamic range of the signal generator is therefore required to provide accurately level-controlled signals for meaningful receiver tests.

The R&S®SMA100B together with the R&S®SMAB‑K721 scan AM option is the perfect choice for this  application. Thanks to its highly sophisticated RF output unit, it produces amplitude-modulated signals with a modulation depth larger than 70 dB. This allows very  accurate simulation of peaks and nulls in complex antenna patterns. The outstanding attenuation accuracy of the R&S®SMA100B ensures repeatable, high-quality signal generation, enabling engineers to reliably test the sensitivity and functionality of state-of-the-art radar and EW receivers.