Product Overview
When characterizing active devices, having an analyzer that combines speed and performance gives you a competitive edge. During the R&D process, the PNA series vector network analyzers deliver exceptional measurement integrity, helping you gain deeper insights and develop superior designs. On the production line, our PNA series analyzers provide the throughput and repeatability required to transform excellent designs into highly competitive products.
The Keysight PNA series vector network analyzers are available in three families, offering the right combination of speed, performance, and price to meet your specific needs.
Choose between three PNA network analyzer series to get the right balance of speed and performance：
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PNA-X Series
N5249B 900 Hz/10 MHz to 8.5 GHz
N5241B 900 Hz/10 MHz to 13.5 GHz
N5242B 900 Hz/10 MHz to 26.5 GHz
N5244B 900 Hz/10 MHz to 43.5 GHz
N5245B 900 Hz/10 MHz to 50 GHz
N5247B 900 Hz/10 MHz to 67 GHz (70 GHz)
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PNA Series
N5221B 900 Hz/10 MHz to 13.5 GHz
N5222B 900 Hz/10 MHz to 26.5 GHz
N5224B 900 Hz/10 MHz to 43.5 GHz
N5225B 900 Hz/10 MHz to 50 GHz
N5227B 900 Hz/10 MHz to 67 GHz (70 GHz)
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PNA-L Series
N5239B 300 kHz to 8.5 GHz
N5231B 300 kHz to 13.5 GHz
N5232B 300 kHz to 20 GHz
N5234B 10 MHz to 43.5 GHz
N5235B 10 MHz to 50 GHz
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Key Features
Characterize Broadband Millimeter-Wave Devices
Why waste time struggling to build a millimeter-wave (mm-Wave) VNA from scratch when our preconfigured test set makes it simple? Our broadband mm-Wave VNA solution includes a two-port or four-port network analyzer with the necessary mm-Wave cabling, frequency extenders, and test-set controller.
With the Keysight N5290/91A, build your solution from either a PNA or PNA-X network analyzer and get enhanced broadband mm-Wave device characterization and modeling for on-wafer and connectorized measurements.
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The Customer Power Behind Our Instruments
Pushing the boundaries of technology requires instantaneous bandwidth, spurious-free dynamic range, and signal fidelity beyond basic measurements. Keysight powers every performance product with custom MMICs, designed in-house and manufactured in our proprietary indium phosphide (InP) and gallium arsenide (GaAs) fab with custom ASIC signal processing that ensures fast and reliable measurements. Count on Keysight to accelerate your next innovation. The PNA-X is more than just another vector network analyzer—it's precision performance with a simplified setup. In the PNA-X, Keysight semiconductors enable innovative source-per-port architecture for fast measurement speed with excellent power, phase noise, and measurement stability.
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Replace Racks
With its highly integrated and versatile hardware and reconfigurable measurement paths, the PNA-X replaces racks and stacks of equipment — with a single instrument. One PNA-X can take the place of the following test gear:
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network analyzer
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spectrum analyzer
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two signal sources
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noise figure meter/analyzer
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power meters
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switch matrix
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digital voltmeter
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Easily Measure Frequency Converters
Mixers and frequency converters provide the frequency translation that wireless and satellite communications systems depend on. Understanding relative and absolute group delay for frequency converters critically impacts the overall system design. However, these measurements prove difficult to capture if your frequency converter's local oscillator (LO) is inaccessible. Solve your group delay difficulties with frequency-tracking software that simulates locking the mixer's LO to a reference signal. This software provides fast and simple measurements and requires no additional hardware.
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Optimize On-wafer Measurement
Highly integrated devices require more measurements with fewer connections. When full device characterization requires multiple instruments, fewer available connections present a time-consuming challenge. Significantly reduce your wafer test times with a flexible single-connection, multiple-measurement (SCCM) network analyzer.
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PNA Software
Investigate, characterize, and troubleshoot your designs with a variety of measurement applications using network analysis software tools. The advanced test software applications available on the PNA network analyzer make it an industry leader in testing amplifiers, mixers, and frequency converters. Reduce your test time and gain confidence in your measurements with applications such as pulsed RF, gain compression, intermodulation distortion, and noise figure.
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The PNA series vector network analyzers are widely used across a broad range of applications, from basic RF component testing to complex system analysis. They demonstrate core value particularly in high-frequency, high-precision, and multi-port scenarios:
1. Communication Systems and RF Device Testing
• RF Device Performance Verification:
-- Filters/Amplifiers/Antennas: Measure S-parameters (e.g., reflection coefficient S11, transmission coefficient S21), gain, bandwidth, insertion loss, etc., to optimize frequency response (e.g., bandwidth calibration for 5G base station filters).
-- Mixers/Converters: Evaluate conversion loss, LO leakage, harmonic suppression, and support multi-port synchronous measurements (e.g., joint analysis of LO, IF, and RF ports).
• Communication Protocol Compliance Testing: Supports signal integrity analysis for high-frequency communication standards such as Wi-Fi 6E and 5G NR, Uses Time Domain Reflectometry (TDR) to identify PCB trace impedance mismatch issues.
2. Radar and Satellite System Development
• Radar Component Characterization:
-- Measures antenna radiation efficiency and beam pointing accuracy, and utilizes time-domain gating to separate multipath interference signals.
-- Analyzes nonlinear characteristics of power amplifiers (PAs), such as intermodulation distortion (IMD) and noise figure, ensuring stability in radar transmit chains.
• Satellite Payload Verification: Tests gain flatness and phase noise of low-noise amplifiers (LNAs) in millimeter-wave bands (e.g., Ka-band). Combines calibration techniques to eliminate cable loss effects.
3. Semiconductor and Materials Science
• Wafer-Level Device Testing: Connects to a probe station for on-wafer measurement of S-parameters and noise figures of RFICs. Supports fixture de-embedding techniques to eliminate parasitic effects from test fixtures.
• Material Electromagnetic Characterization: Analyzes dielectric constant (ε_r) and permeability (μ_r) of substrates for material selection in high-frequency PCBs or development of stealth materials.
4. Automotive Electronics and Industrial Control
• Automotive Radar Module Testing: Verifies transmit power, receive sensitivity, and phase consistency of 77 GHz mmWave radar antenna arrays to ensure reliability of ADAS systems.
• Industrial Sensor Calibration: Measures impedance matching characteristics of ultrasonic sensors or wireless modules to optimize signal transmission efficiency.
5. Medical and Biomedical Engineering
• Biological Tissue Electromagnetic Research: Measures the dielectric constant of human tissue using an open coaxial probe, providing data support for microwave hyperthermia device development.
6. Military and Electronic Warfare
• Stealth Technology Evaluation: Measures radar cross-section (RCS) of aircraft to evaluate the electromagnetic wave attenuation performance of radar-absorbing materials.
• Electronic Jamming Equipment Testing: Analyzes spectral purity, phase noise, and dynamic power range of jamming signals to optimize anti-jamming performance in electronic warfare systems.
Typical Application Examples
• Case 1: In a 5G Massive MIMO antenna test, PNA-X reduced phase consistency calibration time for antenna elements by 70% through multi-port parallel measurement.
• Case 2: A semiconductor manufacturer used the wafer test capability of PNA-L to increase the yield rate of RF switches from 85% to 98%.
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