Key Features

• Convenient and Efficient Calibration with Wizard-Guided Operation
• Integrated Multifunctional User Interface
• Wide Dynamic Measurement Range with Low Trace Noise
• Automatic Fixture Removal for On-Wafer Testing Extension
• Single-Ended to Balanced Optoelectronic Device Measurement Mode
• Comprehensive Toolbox for Versatile Applications
• Internal and External Wavelength Source Configuration
• Fast Automatic Light Source Power Calibration

Convenient and Efficient Calibration with Wizard-Guided Workflow

The 6433 Series Lightwave Component Analyzer features a clear and streamlined calibration process, primarily including electrical calibration and optical path parameter calibration. By employing a wizard-guided interface, the instrument provides users with step-by-step instructions to achieve fast and high-precision calibration.

Integrated Multi-functional Operation Interface

The 6433 Series Lightwave Component Analyzer features four measurement modes — electrical-electrical (EE), electrical-optical (EO), optical-electrical (OE), and optical-optical (OO) — as well as four corresponding optoelectronic calibration modes. These functional modes can be freely switched to meet the measurement requirements of most general-purpose devices, including S-parameters, impedance, and time-domain parameters.

Wide Dynamic Measurement Range with Low Trace Noise

By utilizing high-precision internal components with flat response characteristics and setting different intermediate frequency (IF) bandwidth values, the analyzer achieves an extended dynamic measurement range and significantly reduced trace noise, enabling the capture of finer details in measurement results.

Automatic User Data Removal for Extended On-Wafer Testing

By using user-defined or fixture de-embedding data, the measurement accuracy is improved. This feature is especially useful for removing probe-related errors during on-wafer testing, making the measurement process more flexible and adaptable to various testing scenarios.

Single-Ended to Balanced Optoelectronic Device Mode Measurement

The instrument can be configured to meet the test requirements for differential gain and common-mode rejection ratio (CMRR) of single-ended-to-single-ended and single-ended-to-balanced optical transmit or receive devices or modules. This capability better aligns with current and future multi-port parameter measurement scenarios in the field of high-speed optical fiber communications.

Multi-functional Toolbox

The instrument features an integrated and functionally interconnected optical transmit and receive architecture. It includes a built-in optical power meter with a wide dynamic range, enabling real-time monitoring of input optical power for internal and external light source calibration.
With advanced configuration options, it can provide polarization-maintaining light sources required for Mach-Zehnder (M-Z) LiNiO₃ modulators.
The optical receiver module offers an absolute frequency response greater than -3 dB, ensuring accurate extraction of weak signals. Additionally, the dual-port optical receiver measurement setup provides users with a wider range of measurement flexibility and selection options.

Internal and External Light Source Wavelength Setting for Extended Communication Wavelength Testing

The testing is not limited to 1310nm/1550nm wavelengths. The instrument supports external light source input in the range of 1260nm to 1610nm, covering a broader communication wavelength range. This capability meets the measurement requirements of key components in CWDM and DWDM systems.