Product Overview
The 6433P Lightwave Component Analyzer is designed for testing the modulation characteristics of high-speed electro-optic devices, optoelectronic devices, and all-optical devices. It operates within frequency range from 10MHz to 110GHz and integrates four test modes: electrical-electrical (EE), electrical-optical (EO), optical-electrical (OE), and optical-optical (OO). The analyzer supports multiple display formats, including logarithmic/linear amplitude, phase, group delay, Smith chart, and polar coordinates. It enables precise measurement of the amplitude and phase frequency characteristics of optoelectronic networks.
This tester is primarily used for testing frequency response parameters such as bandwidth, amplitude/frequency response, phase/frequency response, and group delay of high-speed electro-optic devices (e.g., electro-optic intensity modulators, directly modulated lasers, optical transmitter modules), optoelectronic devices (e.g., detectors, optical transmitter modules, detector chips), and all-optical devices (e.g., optical attenuators, EDFA).
Key Features
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Key Features
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10MHz to 110GHz wideband coaxial coverage;
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Minimum frequency resolution of 1Hz;
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Rich test functions, capable of measuring transmission, reflection etc. parameters;
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Integrated multifunctional test interface;
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Wizard-guided calibration and one-button quick frequency sweep test;
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Multi-window display and fast analysis;
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Automatic fixture removal for rapid acquisition of probe data;
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Equipped with USB, LAN interfaces and SCPI programming commands for automated testing.
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10MHz~110GHz Wideband Coaxial Coverage
The 6433P Lightwave Component Analyzer supports a maximum modulation frequency of up to 110GHz and a minimum frequency resolution of 1Hz, enabling high-speed wideband testing of optical device and photonic chip modulation characteristics.
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Integrated Multi-functional Test Wizard Interface
The 6433P Lightwave Component Analyzer support four test modes — electrical-electrical (EE), electrical-optical (EO), optical-electrical (OE), and optical-optical (OO) — which can be freely switched to meet the measurement requirements of various optical components, including S-parameters, impedance, and time-domain parameters. The integrated multi-functional interface allows users to quickly set up measurement modes, optical wave parameters, optical path de-embedding parameters, RF de-embedding, and more.
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Wizard-Guided Calibration and One-Button Testing
The 6433P Lightwave Component Analyzer uses a wizard-guided calibration process for both microwave-domain electrical calibration and optical-domain optical path calibration, enabling users to quickly calibrate the instrument and obtain accurate measurement results for the device under test. Additionally, with its integrated design and core algorithms, the analyzer supports one-button broadband frequency sweep testing for electro-optic (EO), optoelectronic (OE), and all-optical (OO) devices, significantly improving testing efficiency.
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Multi-Window Rapid Display and Analysis
The 6433P Lightwave Component Analyzer supports up to 64 measurement channels and 32 measurement windows, with each window capable of displaying up to 16 test traces simultaneously. This enables multi-window, multi-format display of results for comprehensive and efficient analysis.
The high-resolution multi-touch capacitive screen allows for quick input and selection operations, providing a fast and user-friendly experience. It helps users rapidly analyze data and significantly enhances the overall usability of the instrument, delivering a new level of operational experience in optical component testing.
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Automatic Fixture Removal for Fast Probe Data Acquisition
The 6433P Lightwave Component Analyzer uses its automatic fixture removal function to quickly address challenges in S-parameter testing of photonic chips. During testing, the high-frequency probe is modeled as a fixture. By applying the automatic fixture removal function, the time-domain parameters of the probe are measured, and frequency-domain parameters are extracted using a signal flow graph. This process generates an s2p file, which enables high-precision S-parameter testing of photonic chips through RF de-embedding.
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1. Single-Ended Optical Device Testing
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For electro-optic devices such as electro-optic modulators and directly modulated lasers, the S11 and S21 parameter testing can be efficiently performed using the multi-window display function, enabling rapid acquisition of reflection and transmission characteristics across different frequency points.
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For optoelectronic devices such as photodetectors, ROSA (Receiver Optical Sub-Assemblies), and TIA (Transimpedance Amplifier) integrated modules, S22 and S21 parameter testing can be conducted, with the cursor function allowing quick analysis of the 3 dB bandwidth to evaluate the device's frequency response performance.
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For all-optical devices such as optical fiber filters, S21 parameter testing enables fast measurement of key indicators including insertion loss and flatness.
Amplitude-Frequency Characteristic Testing
By utilizing the various display modes provided by the instrument, information such as phase and group delay can be displayed, enabling rapid measurement of key indicators including phase-frequency characteristics.
Phase-Frequency Characteristic Testing
2. Balanced Optical Device Testing
By configuring a four-port model, the Lightwave Component Analyzer meets the test requirements for differential gain and common-mode rejection ratio (CMRR) of balanced optical transmit or receive devices. This capability better aligns with current and future measurement scenarios in the field of high-speed optical fiber communications, where multi-port parameter analysis is increasingly important.
3. On-Wafer Testing of Photonic Chips
The 6433P Lightwave Component Analyzer, when used with a probe station and high-frequency probes, enables the measurement of frequency response parameters for electro-optic (EO) and optoelectronic (OE) photonic chips. This provides an efficient and accurate solution for on-wafer testing of integrated optical devices.
4. Automated Testing
The 6433P Lightwave Component Analyzer provides a standard SCPI command set for easy remote control. Through the LAN interface, users can establish a connection and send commands to implement an integrated automated test solution. This enables seamless integration of the analyzer with temperature controllers, source measure units (SMUs), and devices under test (DUTs), facilitating the construction of a comprehensive photonic chip testing system.
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